banner-services2 Emission Microscopy

Failure Analysis Services

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Technique
Emission Microscopy (EMMI)
Application

Emission Microscopy is an efficient failure analysis technique used to detect and localize IC failures such as gate oxide defects, ESD failure, junction leakage, latch-up, etc. EMMI consists of a highly-sensitive CCD camera capable of detecting photons emitted in the device and can be performed from either the front or back of IC devices.

photo EMMI

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