Test
ESD - HBM / MM
Condition
- JESD22-A114 (HDB) [100pF / 1.5K ohm]
- JESD22-A115 (MM)
Require ESD board /pkg
Application
To classify micro-circuits accordingly to their susceptibility to damage or degradation by exposure to electrostatic discharge
Test
Latch-Up
Condition
JESD78 Or per customer specification
Application
To determine the level of susceptibility to damage from current or voltage induced latch-up in a micro-circuit
